|
週次 |
日期 |
單元主題 |
|
第1週 |
2/23 |
Lecture: 01 Introduction |
|
第2週 |
3/02 |
Lecture: 02 Fault Modeling |
|
第3週 |
3/09 |
Lecture: 03 DfT_I
Discussion: IDTC05 (Outlier Identification) |
|
第4週 |
3/16 |
Lecture: 03 DfT_I (cont'd)
Discussion: ETS12 (Cell Aware) |
|
第5週 |
3/23 |
Lecture 05: DfT_II Delay Test
Presentation: IDTC05 (Outlier Identification) |
|
第6週 |
3/30 |
Lecture 06: DfT_III Test Compression
Presentation: ETS12 (Cell Aware) |
|
第7週 |
4/06 |
Lecture 07: Memory Testing
Discussion: TCAD14 (Cell Aware) |
|
第8週 |
4/13 |
Lecture 07: Memory Testing (cont'd)
Discussion: IDTC02 (Outlier Screening) |
|
第9週 |
4/20 |
Lecture 07: Memory Testing (cont'd)
Presentation: TCAD14 (Cell Aware)
（期中考週） |
|
第10週 |
4/27 |
Lecture 10: High-Speed Serial Link Testing
Presentation: IDTC (Outlier Screening) |
|
第11週 |
5/04 |
Lecture 10: High-Speed Serial Link Testing (cont'd)
Discussion: ITC02 (Redundancy Implications) |
|
第12週 |
5/11 |
Lecture 10: High-Speed Serial Link Testing (cont'd)
Lecture 12: Coherent Sampling
Discussion: ITC07 (Embedded Multi-Detect) |
|
第13週 |
5/18 |
Presentation: ITC02 (Redundancy Implications) |
|
第14週 |
5/25 |
Lecture 13: AMS Testing (cont'd)
Lecture 14: Static ADC/DAC Testing
Presentation: ITC07 (Embedded Multi-Detect) |
|
第15週 |
6/01 |
考試（openbook, till coherent sampling） |
|
第16週 |
6/08 |
Lecture 14: Static ADC/DAC Testing (cont'd)
Lecture 16: Low Power Testing |
|
第17週 |
6/15 |
Lecture 16: Low Power Testing (cont'd) |
|
第18週 |
06/22 |
期末計畫報告（期末考週） |